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SNJ54ABT8646JT спецификации: SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
Аналогичные SNJ54ABT8646JT
- SNJ5400J
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5400W
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5400WA
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5401J
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
- SNJ5401W
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
- SNJ5402J
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
- SNJ5402J
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
- SNJ5402W
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
SNJ54ABT8646JT Datasheet и спецификация
Производитель : TI
Упаковка : JT
Pins : 28
Темп. диапазон : Минимум -55 °C | Макс 125 °C
Размер : 426 KB
Заявка : SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
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