SN74LVTH182512DGGR спецификации: 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

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SN74LVTH182512DGGR Datasheet и спецификация

Производитель : TI

Упаковка : DGG

Pins : 64

Темп. диапазон : Минимум -40 °C | Макс 85 °C

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Заявка : 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS