Аналогичные SN74ABT3611-30PQ

  • SN74BCT8374ADWR
    • SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
  • SN74ABT623N
    • OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
  • SN74AHC541PWR
    • OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
  • SN74S260D
    • DUAL 5-INPUT POSITIVE-NOR GATES
  • SN74LVTH16652DLR
    • 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
  • SN7405N3
    • HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
  • SN74AHC74PWLE
    • DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
  • SN74HC02DBR
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74ABT3611-30PQ Datasheet и спецификация

Производитель : TI 

Упаковка : PQ 

Pins : 132 

Темп. диапазон : Минимум 0 °C | Макс 70 °C

Размер : 404 KB

Заявка : 64 X 36 SYNCHRONOUS FIFO MEMORY 

SN74ABT3611-30PQ Скачать PDF

SN74ABT3611-30PQ PDF